System and method for statistical timing analysis of digital...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing

Reexamination Certificate

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C716S108000, C703S016000

Reexamination Certificate

active

08010921

ABSTRACT:
The present invention is a system and method for statistical or probabilistic static timing analysis of digital circuits, taking into account statistical delay variations. The delay of each gate or wire is assumed to consist of a nominal portion, a correlated random portion that is parameterized by each of the sources of variation and an independent random portion. Arrival times and required arrival times are propagated as parameterized random variables while taking correlations into account. Both early mode and late mode timing are included; both combinational and sequential circuits are handled; static CMOS as well as dynamic logic families are accommodated. The timing analysis complexity is linear in the size of the graph and the number of sources of variation. The result is a timing report in which all timing quantities such as arrival times and slacks are reported as probability distributions in a parameterized form.

REFERENCES:
patent: 5181226 (1993-01-01), Cantwell
patent: 5383167 (1995-01-01), Weil
patent: 7080290 (2006-07-01), James et al.
patent: 7111260 (2006-09-01), Visweswariah
patent: 7149674 (2006-12-01), Sirichotiyakul et al.
patent: 7428716 (2008-09-01), Visweswariah
patent: 2004/0002844 (2004-01-01), Jess et al.
patent: 2005/0066296 (2005-03-01), Visweswariah
patent: 2006/0277513 (2006-12-01), Visweswariah
patent: 2004274567 (1992-09-01), None
patent: 2002279012 (2002-09-01), None
Jess et al., “Statistical Timing of Parametric Yield Prediction of Digital Integrated Circuits”, Design Automation Conference, 2003, pp. 932-937.
Scheffer, Lou, “Explicit Computation of Performance as a Function of Process Variation”, TAU, 2002, pp. 1-8.
Gattiker et al., “Timing Yield Estimation from Static Timing Analysis”, International Symposium on Quality Electronic Design, 2001, pp. 437-442.
Liou et al., “Fast Statistical Timing Analysis by Probabilistic Event Propagation”, Design Automation Conference, 2001, pp. 661-666.
Nishimoto et al., “A Statistical Static Timing Analyzer for CMOS Combinatorial Circuits Considering Correlations Between Delays”, Technical Report of IBICB, Nov. 23, 2000, vol. 100, No. 475, English Translation of Abstract.
U.S. Appl. No. 10/666,353, filed Sep. 19, 2003, Notice of Allowance and Fees Due dated May 21, 2008.
U.S. Appl. No. 10/666,353, filed Sep. 19, 2003, Office Action dated Dec. 11, 2007.
U.S. Appl. No. 10/666,470, filed Sep. 13, 2003, Notice of Allowance and Fees Due dated Apr. 17, 2006.
U.S. Appl. No. 10/666,470, filed Sep. 13, 2003, Final Office Action dated Feb. 17, 2006.
U.S. Appl. No. 10/666,470, filed Sep. 13, 2003, Office Action dated Oct. 24, 2005.
Ababei et al., “Timing Minimization by Statistical Timing hMetis-based Partitioning”, Proceedings of the 16th International Conference on VLSI Design, 2003, 6 pages.

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