Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2004-07-12
2008-10-07
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C356S512000
Reexamination Certificate
active
07433058
ABSTRACT:
An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The optical path of at least one portion of intensity coming from one of the regions is modified while obtaining at least one image, wherein each image contains the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated with the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.
REFERENCES:
patent: 3814521 (1974-06-01), Free
patent: 4349277 (1982-09-01), Mundy et al.
patent: 5383025 (1995-01-01), Forrest
patent: 5793488 (1998-08-01), Kulawiec et al.
patent: 7023559 (2006-04-01), Coulombe et al.
patent: 2001/0043333 (2001-11-01), Groot et al.
patent: 2002/0018118 (2002-02-01), Coulombe et al.
patent: 2003/0016366 (2003-01-01), Takeda et al.
patent: WO2004/046645 (2004-09-01), None
Cantin Michel
Quirion Benoit
Bereskin and Parr
SolVision Inc.
Turner Samuel A.
LandOfFree
System and method for simultaneous 3D height measurements on... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for simultaneous 3D height measurements on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for simultaneous 3D height measurements on... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4013159