Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2007-08-28
2007-08-28
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S528000, C324S531000, C324S525000, C324S512000
Reexamination Certificate
active
11427067
ABSTRACT:
A system and method for sensing the formation of tin whiskers is presented. An assembly substrate includes whisker detectors at various locations for detecting tin whiskers in an X direction, a Y direction, and a Z direction relative to the assembly substrate. Each whisker detector includes sense traces and a trace bridge that produce “planar gaps” and “orthogonal gaps” that are smaller than trace gaps produced by other traces on the assembly substrate. As such, tin whiskers short across the planar gaps and orthogonal gaps before they short across trace gaps. When the assembly substrate is finished with processing steps, a system tester performs a continuity test on the whisker detectors. When the continuity test fails, an operator is notified to check for tin whiskers on the assembly substrate. Once shipped, a processor monitors the whisker detectors for shorts throughout the product's lifecycle.
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Benton Farrel David
Branch Shane Christopher
Kapinos Robert J.
Rojas Alberto Jose
Rutledge James Stephen
Deb Anjan
Lenovo (Singapore) Pte. Ltd
Munoz-Bustamante Carlos
Valone Thomas
Van Leeuwen & Van Leeuwen
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