System and method for sensing capacitance change of a...

Details System and method for sensing capacitance change of a... System and method for sensing capacitance change of a...

2006-06-02

2008-03-04

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S658000

Reexamination Certificate

active

07339384

ABSTRACT:
The present invention relates to systems and methods for sensing capacitance change of a capacitive sensor and for optimizing a capacitive sensing circuit. In an exemplary embodiment, a capacitive sensor may be coupled to an amplifier at floating node. A programming circuit is connected to the floating node for controlling a charge on the floating node. A method of controlling the charge of the floating node is also provided. The method includes applying a first predetermined voltage to a source of a programming transistor, applying a second predetermined voltage to a floating gate of the programming transistor, and applying a third predetermined voltage to a drain of the programming transistor until a charge on the floating gate of the programming transistor reaches a predetermined value. The charge on the floating gate of the programming transistor drives the charge on the floating node to the predetermined value, and thus is controlled.

REFERENCES:
patent: 6556025 (2003-04-01), Nathan et al.
patent: 6960945 (2005-11-01), Bonin
patent: 7102438 (2006-09-01), Colleran et al.
patent: 2003/0006902 (2003-01-01), Tullis et al.
patent: 2003/0155966 (2003-08-01), Harrison
patent: 2007/0013264 (2007-01-01), Wilser et al.
Int'l Search Report & Written Opinion for corresponding PCT Application No. PCT/US2006/021443 dated May 29, 2007.

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