Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2005-08-08
2008-11-25
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
07457726
ABSTRACT:
A system and method for obtaining processor diagnostic data. The method can include receiving a instruction, enabling write access of an output stream to a diagnostic memory, writing to the diagnostic memory at a first frequency, and reading from the diagnostic memory at a second frequency where the first frequency is greater than the second frequency.
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International Search Report from PCT Application PCT/US2005/032177.
Boesel Robert W.
Cohen Lewis Neal
Myers Theodore Jon
Nguyen Tien Q.
Price Frederick Wales
Bui Bryan
Foley & Lardner LLP
Freescale Semiconductor Inc.
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