Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2007-05-30
2010-11-23
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
C702S156000, C702S158000, C702S166000
Reexamination Certificate
active
07840373
ABSTRACT:
A system and associated method for selecting or creating an area which meets meet a set of marking criteria, for example, corresponding to a minimum surface area; a maximum slope angle; and a minimum deviation from a specified height. A marking station is directed to mark the selected area that meets the marking criteria.
REFERENCES:
patent: 5431562 (1995-07-01), Andreiko et al.
patent: 5857853 (1999-01-01), van Nifterick et al.
patent: 6165406 (2000-12-01), Jang et al.
patent: 7084868 (2006-08-01), Farag et al.
patent: 7293988 (2007-11-01), Wen
patent: 7352891 (2008-04-01), Suzuki et al.
Borovinskih Artem
Culp James C.
Farren Craig E.
Kuo Eric
Align Technology Inc.
Klein O'Neill & Singh, LLP
Suarez Felix E
Wachsman Hal D
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