System and method for selecting a location for marking...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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C702S156000, C702S158000, C702S166000

Reexamination Certificate

active

07840373

ABSTRACT:
A system and associated method for selecting or creating an area which meets meet a set of marking criteria, for example, corresponding to a minimum surface area; a maximum slope angle; and a minimum deviation from a specified height. A marking station is directed to mark the selected area that meets the marking criteria.

REFERENCES:
patent: 5431562 (1995-07-01), Andreiko et al.
patent: 5857853 (1999-01-01), van Nifterick et al.
patent: 6165406 (2000-12-01), Jang et al.
patent: 7084868 (2006-08-01), Farag et al.
patent: 7293988 (2007-11-01), Wen
patent: 7352891 (2008-04-01), Suzuki et al.

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