Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-12-28
2010-06-29
Bali, Vikkram (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S152000, C382S197000, C382S203000
Reexamination Certificate
active
07747080
ABSTRACT:
An exemplary method for edge scan of an image is provided. The method includes: setting parameters of an image edge scan; setting parameters for scanning edges of the workpiece; obtaining an image of the workpiece; processing the image and designating a point in the image; searching a first edge point near the designated point in a clockwise direction, wherein there is at least one point adjacent to the first edge point whose color is different with the color of the first edge point; searching other edge points in the manner of searching the first edge point by utilizing a recursive method; calculating coordinates of initial points and end points of scan lines according to the parameters, and searching scanned points according to the initial points and end points on the image that has not been processed; scanning edges of the image based on the scanned points. A related system is also provided.
REFERENCES:
patent: 6393159 (2002-05-01), Prasad et al.
patent: 6694057 (2004-02-01), Miller et al.
patent: 6900801 (2005-05-01), Lee
patent: 2002/0025073 (2002-02-01), Shibuya
Chang Chih-Kuang
Jiang Li
Sun Xiao-Chao
Bali Vikkram
Chung Wei Te
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Park Soo Jin
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