Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-07-12
2005-07-12
Chang, Jon (Department: 2623)
Image analysis
Pattern recognition
Feature extraction
C382S316000, C382S322000
Reexamination Certificate
active
06917710
ABSTRACT:
A scanning system and method for scanning for an object within a region, or for locating a point within a region. Embodiments of the invention include a method for scanning for an object within a region using a Low Discrepancy Curve (LDC) scanning scheme. The method may: 1) generate a Low Discrepancy Sequence (LDS) of points in the region; 2) calculate an LDC in the region based on the LDS of points; and 3) scan the region along the LDC to determine one or more characteristics of the object in response to the scan. In calculating the LDC in the region based on the LDS of points, the method may connect sequential pairs of the LDS with contiguous orthogonal line segments (each parallel to a respective axis of the region), then sample the segments, generating points which may be used to generate the LDC, such as by a curve fit.
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Nair Dinesh
Rajagopal Ram
Wenzel Lothar
Chang Jon
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
Williams Mark S.
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