Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2006-03-07
2006-03-07
Lee, Andrew H. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
C356S491000
Reexamination Certificate
active
07009691
ABSTRACT:
By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.
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Baney Douglas M.
VanWiggeren Gregory D.
Agilent Technologie,s Inc.
Krause-Polstorff Juergen
Lee Andrew H.
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