System and method for removing measurement errors from...

Details System and method for removing measurement errors from... System and method for removing measurement errors from...

2007-01-30

2007-01-30

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S076280, C324S601000, C702S085000, C702S107000

Reexamination Certificate

active

11251426

ABSTRACT:
A test system and method which utilizes a component data base that stores performance data for individual component of the system. The system and method can further provide for using data and information from one calibration procedure in connection with performing further calibration procedures. The system and method can further provide for utilizing data of from linear components of the system to determine performance characteristics of non-linear components.

REFERENCES:
patent: 6842608 (2005-01-01), Cutler
patent: 6940922 (2005-09-01), Cutler
patent: 6989663 (2006-01-01), Nagle
patent: 7054776 (2006-05-01), Bradley et al.
patent: 7054780 (2006-05-01), Dunsmore et al.
Pending U.S. Appl. No. 11/127,961, “Topology-Independent Calibration System,” filed May 12, 2005.

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