System and method for reducing temperature variation during...

Details System and method for reducing temperature variation during... System and method for reducing temperature variation during...

2007-07-24

2007-07-24

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

Reexamination Certificate

active

10791099

ABSTRACT:
Systems and methods for reducing temperature variation during burn-in testing. In one embodiment, power consumed by an integrated circuit under test is measured. An ambient temperature associated with the integrated circuit is measured. A desired junction temperature of the integrated circuit is achieved by adjusting a body bias voltage of the integrated circuit. By controlling temperature of individual integrated circuits, temperature variation during burn-in testing can be reduced.

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