System and method for reducing current in a device during...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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C324S719000

Reexamination Certificate

active

11444087

ABSTRACT:
A method for testing an electronic assembly (10) is provided. A portion (22) of the electronic assembly is electrically isolated from a remainder (24) of the electronic assembly. Power is provided to the electronic assembly such that a reduced amount of current flows only through the portion of the electronic assembly. The reduced amount of current is determined. A combined amount of current flowing through both the portion and the remainder of the electronic assembly when power is provided to both the portion and the remainder of the electronic assembly is calculated based on the reduced amount of current.

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patent: 6617069 (2003-09-01), Hopper
patent: 6759856 (2004-07-01), Tse et al.
patent: 6870720 (2005-03-01), Iwata
patent: 2003/0206025 (2003-11-01), Tse
patent: 2004/0201077 (2004-10-01), Momohara
patent: 2005/0162144 (2005-07-01), Kernahan
patent: 2005/0195038 (2005-09-01), Neenan
patent: 2005/0200406 (2005-09-01), Dauphinee
patent: 2005/0225925 (2005-10-01), Sibrai

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