Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate
2008-01-04
2011-12-06
Tsai, Carol (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
C702S006000, C175S038000, C175S048000, C175S066000, C166S250010, C367S027000, C700S032000, C700S083000, C700S090000
Reexamination Certificate
active
08073623
ABSTRACT:
An illustrative embodiment of a method is disclosed for assessing image quality of a down hole formation image, the method comprising collecting acquisition system data from a plurality of sensors down hole; applying a set of rules to the acquisition system data to obtain an acquisition quality indicator; and presenting the acquisition quality indicator at a surface location. A system is disclosed for performing the method.
REFERENCES:
patent: 5397893 (1995-03-01), Minette
patent: 6282452 (2001-08-01), DeGuzman et al.
patent: 6405798 (2002-06-01), Barrett et al.
patent: 6446718 (2002-09-01), Barrett et al.
patent: 6584837 (2003-07-01), Kurkoski
patent: 6727696 (2004-04-01), Kruspe et al.
patent: 6820702 (2004-11-01), Niedermayr et al.
patent: 6845819 (2005-01-01), Barrett et al.
patent: 7143844 (2006-12-01), Alft et al.
patent: 7225078 (2007-05-01), Shelley et al.
patent: 7242194 (2007-07-01), Hayman
patent: 7350597 (2008-04-01), Reitsma et al.
patent: 7395878 (2008-07-01), Reitsma et al.
patent: 2002/0096322 (2002-07-01), Barrett et al.
patent: 2003/0118230 (2003-06-01), Song et al.
patent: 2004/0040746 (2004-03-01), Niedermayr et al.
patent: 2004/0153245 (2004-08-01), Womer
patent: 2006/0092766 (2006-05-01), Shelley et al.
patent: 2006/0285436 (2006-12-01), Mayorga Lopez et al.
patent: 2007/0112521 (2007-05-01), Akimov et al.
patent: 2007/0151763 (2007-07-01), Reitsma et al.
patent: 2007/0289740 (2007-12-01), Thigpen et al.
Akimov Oleg N.
Baule Ansgar
Fulda Christian
Hartmann Andreas
Baker Hughes Incorporated
Roebuck, P.C. Michael
Tsai Carol
LandOfFree
System and method for real-time quality control for downhole... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for real-time quality control for downhole..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for real-time quality control for downhole... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4265269