Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-01
2008-01-01
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C361S111000
Reexamination Certificate
active
11284557
ABSTRACT:
A system and method of quantifying voltage anomalies may be used to quantify low frequency voltage transients such as the type caused by power factor correction (PFC) or similar events. The system and method of quantifying voltage anomalies receives sampled voltage data values and computes ideal sine wave data values. The system and method of quantifying voltage anomalies may also compute difference data values representing a difference between the received voltage data and the ideal sine wave and may compute score data values such as non-linear score values representing the difference data values relative to a peak voltage value or RMS voltage value.
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Kindseth Erik
Thomas Robert
Bui Bryan
Grossman Tucker Perreault & Pfleger PLLC
Le Toan M.
RX Monitoring Services, LLC
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