System and method for pulsed signal device characterization...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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C702S183000, C375S130000

Reexamination Certificate

active

07623989

ABSTRACT:
A test system and method which employs a filter bank to select different spectral components of a pulsed measurement signal. The filter bank utilizes filter nulls to suppress non-selected spectral components. After filtering the selected spectral components, the spectral components are combined to provide for a measurement signal which is analyzed to determine characteristics of a device being tested. The characteristics of the filters can be adjusted in response to a change in the characteristics of a pulsed signal applied to the device under test, so that the selected spectral components will correspond to desired spectral components generated by the pulsed signal applied to the device under test.

REFERENCES:
patent: 4206323 (1980-06-01), Padgett et al.
patent: 4728958 (1988-03-01), Choate
patent: 5477227 (1995-12-01), Noneman
patent: 5572213 (1996-11-01), Noneman et al.
patent: 5602876 (1997-02-01), Noneman et al.
patent: 5612975 (1997-03-01), Becker et al.
patent: 6384773 (2002-05-01), Martin et al.
patent: 6396298 (2002-05-01), Young et al.
patent: 2006/0158174 (2006-07-01), Marzalek et al.
patent: 2331589 (1999-05-01), None
Robert E. Shoulders et al., “Pulsed Antenna Measurements with the Agilent PNA Microwave Network Analyzers,” Proceedings of the Meeting and Symposium of Antenna Measurement and Techniques Association, Irvine, CA, USA, 2003, pp. 86-91.
Loren Betts et al., “Improved Techniques for High-Performance Pulsed Measurements using Microwave Vector Network Analyzers,” Proceedings of Asia Pacific Microwave Conference (APMC) 2003.
Loren Betts et al., “Make Accurate Pulsed S-Parameter Measurements,” Microwaves and RF, Nov. 2003, vol. 42, No. 11.
David Vondran, “Techniques for Pulsed S-Parameter Measurements,” High Frequency Electronics, Mar. 2003, pp. 50-57.
5989-0563EN “PNA Microwave Network Analyzers, Accurate Pulsed Measurements,” Application Note 1408-11, Agilent Technologies, Inc., Feb. 17, 2004, pp. 1-16.
5989-0221EN “Pulsed Antenna Measurements Using PNA Network Analyzers,” White Paper, Agilent Technologies, Inc., Jan. 6, 2004, pp. 1-12.
5988-7989EN “Agilent PNA Series Microwave Network Analyzers, Configuration Guide,” Agilent Technologies, Inc., Feb. 1, 2004, pp. 1-28.
Pending U.S. Appl. No. 10/883,100, “Pulsed Signal Device Characterization Employing Adaptive Nulling and IF Gating,” filed Jun. 30, 2004.

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