Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-10-03
2006-10-03
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C700S097000
Reexamination Certificate
active
07117117
ABSTRACT:
An environmental impact information collection system modifies and analyzes environmental impact information, which is collected and stored in advance, and obtains the environmental impact at each process done in an organization, according to each product. The environmental impact information collection system then obtains a set of environmental impacts in a product's life cycle.
REFERENCES:
patent: 5311437 (1994-05-01), Leal et al.
patent: 5646863 (1997-07-01), Morton
patent: 5652708 (1997-07-01), Miyamoto et al.
patent: 5768129 (1998-06-01), Miyamoto
patent: 5808916 (1998-09-01), Orr et al.
patent: 5852560 (1998-12-01), Takeyama et al.
patent: 6490569 (2002-12-01), Grune et al.
patent: 6532464 (2003-03-01), Miyamoto
patent: 6701257 (2004-03-01), Sakurai et al.
patent: 2002/0035550 (2002-03-01), Sakurai et al.
patent: 0 921 483 (1999-06-01), None
patent: 0 969 397 (2000-01-01), None
patent: 1 056 028 (2000-11-01), None
patent: 1 113 375 (2001-07-01), None
patent: WO 98/11493 (1998-03-01), None
patent: WO 00/41114 (2000-07-01), None
Eckhard Ignatowitz “Chemietechnik” Verlag Europa-Lehrmittel, pp. 392-397.
Hatano Hiromitsu
Sakurai Masamitsu
Tani Tatsuo
Uramoto Hiroshi
Charioui Mohamed
Morrison & Foerster / LLP
Ricoh & Company, Ltd.
Tsai Carol S. W.
LandOfFree
System and method for providing environmental impact... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for providing environmental impact..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for providing environmental impact... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3700555