Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-10-30
2007-10-30
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S107000
Reexamination Certificate
active
11138582
ABSTRACT:
A system and method is disclosed for providing an improved voltage monitor that is capable of determining that a value of an adjustable supply voltage is suitable for a requested performance level in an adaptive voltage scaling system. An integrator circuit of the voltage monitor integrates a slack time error signal from a hardware performance monitor. Control circuitry evaluates a suitability of the integrated slack time error signal for the requested performance level for a number of voltage evaluation time periods. The adjustable supply voltage is deemed to be stable when the integrated slack time error signal is within a predetermined range of limits for at least two voltage evaluation time periods.
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Yee William Li et al., “Asynchronous Datapath with Software-Controlled On-Chip Adaptive Voltage Scaling for Multirate Signal Processing Applications”, Proceedings of the Ninth International Symposium on Asynchronous Circuits and Systems (ASYNC'03), 2003 IEEE.
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Sandeep Dhar et al., “Switching Regulator with Dynamically Adjustable Supply Voltage for Low Power VLSI”, IECON'01: The 27th Annual Conference of the IEEE Industrial Electronics Society, pp. 1874-1879.
Pennanen Juha
Salmi Pasi
Bui Bryan
National Semiconductor Corporation
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