Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-19
2007-06-19
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C327S105000, C327S277000, C702S107000
Reexamination Certificate
active
11251583
ABSTRACT:
A system and method for adaptively providing a power supply voltage. The system includes an input/output subsystem configured to receive a first voltage, an analog subsystem configured to receive a second voltage and coupled to the input/output subsystem, a first digital subsystem configured to receive a third voltage and coupled to the input/output subsystem, and a second digital subsystem configured to receive a fourth voltage and coupled to the input/output subsystem, the first digital subsystem, and the analog subsystem. Additionally, the system includes a first adaptive power supply configured to receive an input voltage and generate the third voltage, and a second adaptive power supply configured to receive the input voltage and generate the fourth voltage.
REFERENCES:
patent: 7061292 (2006-06-01), Maksimovic et al.
patent: 2005/0062507 (2005-03-01), Naffziger et al.
Chen Feng
Luo Wenzhe
Ouyang Paul
Barlow John
Le John
Semiconductor Manufacturing International (Shanghai) Corporation
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