System and method for providing a time varying gain TDR to...

Details System and method for providing a time varying gain TDR to... System and method for providing a time varying gain TDR to...

2006-10-03

2006-10-03

Nguyen, Tu T. (Department: 2877)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

Reexamination Certificate

active

07116111

ABSTRACT:
In a system and method for testing and displaying the abnormalities, includes opens, shorts, bridged-taps and wet sections, of a copper pair line for xDSL service use, the abnormalities are amplified and normalized so as to be displayed within a predetermined observation range. The normalization steps include piecewise gaining and biasing the reflected pulse of various gains to create a first normalized reflected trace which match the reflected traces within a predetermined observation range and thereby constitute a total smooth curve; and amplifying the first normalized reflected trace according to a function of time to create a second normalized reflected trace so as to eliminate an exponential gain decay curve of a no-fault copper pair line with the same predetermined characteristic parameters from the first normalized reflected trace to thereby obtain a second normalized reflected trace showing any amplified abnormalities.

REFERENCES:
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patent: 5461318 (1995-10-01), Borchert et al.
patent: 6091338 (2000-07-01), Natra
patent: 6097755 (2000-08-01), Guenther et al.
patent: 6195614 (2001-02-01), Kochan
patent: 6757382 (2004-06-01), Wilkes et al.
patent: 6829223 (2004-12-01), Richardson et al.
patent: 2002/0114383 (2002-08-01), Belge et al.

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