Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
Reexamination Certificate
2011-03-22
2011-03-22
Such, Matthew W (Department: 2891)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
C257SE21372
Reexamination Certificate
active
07910447
ABSTRACT:
A system and method are disclosed for providing a self aligned bipolar transistor using a simplified sacrificial nitride emitter. An active region of a transistor is formed and a silicon nitride sacrificial emitter is formed above the active region of the transistor. Then a physical vapor deposition oxide layer is deposited over the silicon nitride sacrificial emitter using a physical vapor deposition process. The physical vapor deposition oxide layer is then etched away from the side walls of the sacrificial emitter. The sacrificial emitter is then etched away to form an emitter window. Then a polysilicon emitter structure is formed in the emitter window. The self aligned bipolar transistor architecture of the invention is compatible with BiCMOS technology.
REFERENCES:
patent: 4746629 (1988-05-01), Hanagasaki
patent: 5064774 (1991-11-01), Pfiester
patent: 5073516 (1991-12-01), Moslehi
patent: 5362658 (1994-11-01), Kuragaki
patent: 5767004 (1998-06-01), Balasubramanian et al.
patent: 5866462 (1999-02-01), Tsai et al.
patent: 6019658 (2000-02-01), Ludwig et al.
patent: 6043554 (2000-03-01), Miwa
patent: 6130136 (2000-10-01), Johnson et al.
patent: 6559020 (2003-05-01), Salmi
patent: 6740552 (2004-05-01), Gonzalez et al.
patent: 6780695 (2004-08-01), Chen et al.
patent: 6869853 (2005-03-01), Gopalan
patent: 6881639 (2005-04-01), Mochizuki et al.
patent: 6884689 (2005-04-01), Chuang et al.
patent: 7018778 (2006-03-01), Leibiger et al.
patent: 7291536 (2007-11-01), Kalburge et al.
patent: 7494887 (2009-02-01), Hussain
patent: 2001/0017399 (2001-08-01), Oda et al.
patent: 2002/0013025 (2002-01-01), Wylie
patent: 2002/0153535 (2002-10-01), Freeman et al.
patent: 2003/0045066 (2003-03-01), Igarashi
patent: 2005/0062088 (2005-03-01), Houston
patent: 2005/0083577 (2005-04-01), Varaprasad et al.
patent: 2005/0142787 (2005-06-01), Ko
patent: 2005/0184359 (2005-08-01), Akatsu et al.
patent: 2005/0233536 (2005-10-01), Bock et al.
patent: 2006/0054595 (2006-03-01), Starzynski
patent: 2006/0113634 (2006-06-01), Ahmed et al.
patent: 2006/0231924 (2006-10-01), Adam et al.
patent: 2006/0249814 (2006-11-01), Greenberg et al.
patent: 2007/0001264 (2007-01-01), Sheridan et al.
Yousuke Yamamoto et al., “SDX: A Novel Self-Aligned Technique and Its Applicaiton to High-Speed Bipolar LSI's,” IEEE Transactions on Electron Devices, vol. 35, No. 10, Oct. 1988, pp. 1601-1608.
Bengt Edholm et al., “A Self-Aligned Lateral Bipolar Transistor Realized on SIMOX-Material,” IEEE Transactions on Electron Devices, vol. 40, No. 12, Dec. 1993, pp. 2359-2360.
Michihiro Inoue et al., “Self-Aligned Complementary Bipolar Transistors Fabricated with a Selective-Oxidation Mask,” IEEE Transactions on Electron Devices, vol. ED-34, No. 10, Oct. 1987, pp. 2146-2152.
Yousuke Yamamoto et al., “SDX: A Novel Self-Aligned Technique and Its Application to High-Speed Bipolar LSI's,” IEEE Transactions on Electron Devices, vol. 35, No. 10, Oct. 1988, pp. 1601-1608.
Bengt Edholm et al., “A Self-Aligned Lateral Bipolar Transistor Realized on SIMOX-Material,” IEEE Transactions on Electron Devices, vol. 40, No. 12, Dec. 1993, pp. 2359-2360.
Michihiro Inoue et al., “Self-Aligned Complementary Bipolar Transistors Fabricated with a Selective-Oxidation Mask,” IEEE Transactions on Electron Devices, vol. ED-34, No. 10, Oct. 1987, pp. 2146-2152.
P. Chevalier, et al., “230 GHz self-aligned SiGeC HBT for 90 nm BiCMOS technology”, 2004 IEEE, p. 225-228.
S. Harrison, et al., “Poly-gate Replacement Through Contact Hole (PRETCH): A new method for High-K/Metal gate and multi-oxide implementation on chip,” IEEE 2004, pp. 12.2.1-12.2.4.
Adler Steven J.
Xu Mingwei
Naraghi Ali
National Semiconductor Corporation
Such Matthew W
LandOfFree
System and method for providing a self aligned bipolar... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for providing a self aligned bipolar..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for providing a self aligned bipolar... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2665151