System and method for preparing shape data for proximity correct

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364488, 364489, 364490, 2504922, 430 30, 430296, G06F 1500, G02B 2700

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054327148

ABSTRACT:
In electron beam lithography, an apparatus and method decompose rectangles at the exterior of a desired electron beam exposure pattern into portions having a substantially constant environment. This process also includes sorting of rectangles into bands in order of addresses of the rectangles and the assignment of labels or tags to the resulting rectangles indicating the edge(s) of the rectangle at which cuts were made to form the rectangle. When these rectangles are further decomposed by increment cutting and processes to receive exposure doses corrected by mutual proximity effects, including recombination of rectangles having the same assigned exposure dose, improved location of cut boundaries is achieved. Overexposure and resultant blooming of the pattern is prevented and exposure dose is assigned with higher accuracy since any averaging of exposure dose will be over a region having a substantially constant environment of neighboring shapes. Additionally, by ordering of the shapes, and cutting (with recombination) in plural steps, data carried forward in subsequent processing is reduced and accumulation of exposure correction information is facilitated.

REFERENCES:
patent: 4099062 (1978-07-01), Kitcher
patent: 4426584 (1984-01-01), Bohlen et al.
patent: 4482810 (1984-11-01), Cooke
patent: 4500789 (1985-02-01), Ban et al.
patent: 4504558 (1985-03-01), Bohlen et al.
patent: 4687988 (1987-08-01), Eichelberger et al.
patent: 4812962 (1989-03-01), Witt
patent: 4816692 (1989-03-01), Rudert, Jr.
patent: 4878177 (1989-10-01), Ikenaga et al.
patent: 4895780 (1990-01-01), Nissan-Cohen et al.
patent: 4943729 (1990-07-01), Ando et al.
patent: 5086398 (1992-02-01), Moriizumi
patent: 5159201 (1992-10-01), Frei
patent: 5182718 (1993-01-01), Hasafuji et al.
IBM Technical Disclosure Bulletin, vol. 22, No. 11, Apr. 1980; "Data Zoning In The Proximity-Effect Correction Technique"; M. Parikh; pp. 5187-5189.
"Verification of a proximity effect correction program in electron-beam lithography"; E. Kratschmer; J. Vac. Sci. Technol., Nov./Dec. 1981; pp. 1264-1268.
IEEE 21st Design Automation Conference, Chapman et al, "The Scan Line Approach to Design Rules Checking: Computational Experiences", pp. 235-241. 1984, No Month.
IBM Technical Disclosure Bulletin, vol. 20, No. 9, Feb. 1978, Chang, et al., "Partitioning E-Beam Data for Proximity Corrections", pp. 3809-3812.
Japanese Journal of Applied Physics, vol. 30, No. 3B, Mar. 1991, Abe, et al., "Representative Figure Method for Proximity Effect Correction", pp. 528-531.

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