Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1997-04-15
1999-05-25
Noori, Max H.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73779, 73780, G01B 716
Patent
active
059071028
ABSTRACT:
A stress-strain test for conductors. A test assembly receives first and second conductive layers and a dielectric layer adjacent each of the conductive layers. The layers are generally ring-shaped and concentric when received by the test assembly and the dielectric layer separates the conductive layers from each other. A magnetic field source provides a magnetic field to the test assembly and a variable current source provides current to the second conductive layer. A circuit measures a change in capacitance between the conductive layers when the current in the second conductive layer is varied whereby the stress and strain characteristics of the second conductive layer are determined as a function of the capacitance change.
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Hascicek Yusuf S.
Hilton David K.
Van Sciver Steven W.
Weijers Huub W.
Florida State University
Noori Max H.
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