Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate
2008-05-27
2008-05-27
Lauchman, L. G. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
C356S237200, C356S429000, C356S240100
Reexamination Certificate
active
07379177
ABSTRACT:
A system and method to inspect objects for a characteristic parameter. The system includes at least one electromagnetic source for emitting at least two separate wavelengths of electromagnetic energy. At least one electromagnetic detector is positioned at a predefined distance from the electromagnetic source to measure an incident intensity value of the electromagnetic energy at the two wavelengths. An object, placed between the electromagnetic source and the electromagnetic detector is irradiated with electromagnetic energy at the two wavelengths and the electromagnetic energy transmitted through the object is measured by the electromagnetic detector. The system includes a computer-based platform operationally connected to the electromagnetic detector for receiving intensity data values from the electromagnetic detector and for computing attenuation ratio values. The attenuation ratio values are used to determine a level of the characteristic parameter.
REFERENCES:
patent: 2309290 (1943-01-01), Aksomitas
patent: 6914678 (2005-07-01), Ulrichsen et al.
patent: 6989857 (2006-01-01), Furnas
patent: 2001/0054680 (2001-12-01), Lindner
patent: 2005/0166413 (2005-08-01), Crampton
Novini Amir
Sones Richard A.
Alli Iyabo S
Applied Vision Company LLC
Hahn Loeser & Parks
Lauchman L. G.
Muzilla David J.
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