System and method for peak current modeling for an IC design

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation

Reexamination Certificate

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C703S002000, C703S013000, C703S020000, C702S064000, C702S066000, C716S030000, C716S030000

Reexamination Certificate

active

07747425

ABSTRACT:
A peak current modeling method and system for modeling peak current demand of an integrated circuit (IC) block such as, e.g., a compilable memory instance. A current demand curve associated with the IC for a particular IC block event is obtained via simulation, for example. A defined time region associated with the particular IC block event is divided into multiple time segments, whereupon at least a first current value and a second current value for each time segment is obtained based on the current demand curve. Thereafter, the current demand curve is approximated, on a segment-by-segment basis, using a select approximate waveform depending on a relationship between the first and second current values.

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Chen et al.; “Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design”; 1997; IBM Research Division; pp. 638-643.

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