Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-02-28
2006-02-28
Bali, Vikkram (Department: 2623)
Image analysis
Pattern recognition
Feature extraction
C382S197000
Reexamination Certificate
active
07006694
ABSTRACT:
A system and method for pattern identification are disclosed. According to one embodiment of the present invention, the method for locating a pattern includes the steps of (1) providing a pattern image corresponding to the pattern to be located; (2) extracting a pattern contour from the pattern image; (3) generating vector information for the pattern contours, relative to a reference point; (4) creating a reference table for storing the vector information, the reference tables corresponding to the pattern contour; (5) providing a scene image, which will be searched for the pattern; (6) extracting a scene contour from the scene image; (7) generating vector information for the scene contours; and (8) determining whether the pattern has been located within the scene image using the reference table and the vector information for the scene contour. According to another embodiment, a system includes a first image capture device that captures a pattern image which includes an image of a pattern; a second image capture device that captures a scene image to be searched for the pattern; a processor for processing the images, which includes means for extracting at least one pattern contour from the pattern image; means for generating vector information for each of said at least one pattern contours, relative to a reference point; means for creating at least one reference table for storing vector information, each of said at least one reference tables corresponding to at least one pattern contour; means for extracting at least one scene contour from a scene image; means for generating vector information for each of said at least one scene contours; and a means for locating the pattern image within the scene image using the at least one reference tables and the vector information for the at least one scene contours.
REFERENCES:
patent: 4648024 (1987-03-01), Kato et al.
patent: 4901362 (1990-02-01), Terzian
patent: 5033099 (1991-07-01), Yamada et al.
patent: 5351310 (1994-09-01), Califano et al.
patent: 5600733 (1997-02-01), MacDonald et al.
patent: 5611036 (1997-03-01), Berend et al.
patent: 5943441 (1999-08-01), Michael
Ballard, “Generalizing the Hough Transform to Detect Arbitrary Shapes,”Pattern Recognition, vol. 13, No. 2, pp. 111-122, 1981.
Ayache et al., “HYPER: A New Approach for the Recognition and Positioning of Two-Dimensional Objects,”IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. PAMI-8, No. 1, pp. 44-54, 1986.
Huttenlocher et al., “Recognizing Solid Objects by Alignment with an Image,”International Journal of Computer Vision, vol. 5, No. 2, pp. 195-212, 1990.
Ansari et al., “On Detecting Dominant Points,”Pattern Recognition, vol. 24, No. 5, pp. 441-451, 1991.
Pao et al., “Shapes Recognition Using the Straight Line Hough Transform: Theory and Generalization,”IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 14, No. 11, pp. 1076-1089, 1992.
Henikoff et al., “Representative Patterns for Model-Based Matching,”Pattern Recognition, vol. 26, No. 7, pp. 1087-1098, 1993.
Wen et al., “Recognition and Inspection of Manufactured Parts Using the Line Moments of Their Boundaries,”Pattern Recognition, vol. 26, No. 10, pp. 1461-1471, 1993.
Gupta et al., “A New Approach for Aggregating Edge Points into Line Segments,”Pattern Recognition, vol. 26, No. 7, pp. 1069-1086, 1993.
Bunke et al., “Applications of Approximate String Matching to 2D Shape Recognition,”Pattern Recognition, vol. 26, No. 12, 1797-1812, 1993.
Toet et al., “Genetic contour matching,”Pattern Recognition Letters, No. 16, pp. 849-856, 1995.
Pikaz et al., “Optimal Polygonal Approximation of Digital Curves,”Pattern Recognition, vol. 28, No. 3, pp. 373-379, 1995.
Pikaz et al., “Matching of Partially Occluded Planar Curves,”Pattern Recognition, vol. 28, pp. 199-209, 1995.
Tsai, “Locating Overlapping Industrial Parts for Robotic Assembly,”Int. J. Adv. Manuf. Technol., vol. 12, pp. 288-302, 1996.
Cass, “Polynomial-Time Geometric Matching for Object Recognition,”International Journal of Computer Vision, 21 (1/2), pp. 37-61, 1997.
Machine Vision: Theory, Algorithms, Practicalities, Circle Detection, pp. 207-212.
Chapter 4, Boundary Detection, pp. 128-131.
D.H. Ballard, “Generalizing The Hough Transform To Detect Arbitary Shapes”, Sep. 23, 1980, pp. 111-122.
Melikian Simon Haig
Tyminski Daren Benedykt
Bali Vikkram
Coreco Imaging, Inc.
Hunton & Williams
LaRose Colin
LandOfFree
System and method for pattern identification does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for pattern identification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for pattern identification will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3656388