System and method for optically sensing defects in OPC devices

Details System and method for optically sensing defects in OPC devices System and method for optically sensing defects in OPC devices

2005-11-08

2005-11-08

Glick, Edward J. (Department: 2882)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C250S559450, C356S237200, C382S141000

Reexamination Certificate

active

06963076

ABSTRACT:
A system for optically sensing manufacturing defects in organic photo conductor (OPC) devices. The system comprising an illumination source for illuminating the OPC device; at least one optical sensor positioned to view the illuminated device; and a controller connectable to the optical sensor, the controller comprising a threshold detector for determining manufacturing defects.

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