System and method for monitoring particles contamination in...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With measuring – sensing – detection or process control means

Reexamination Certificate

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Details

C156S345430, C118S722000, C118S733000

Reexamination Certificate

active

11004099

ABSTRACT:
Provided is a particle monitoring system capable of detecting a level of polymer particle contamination on inner walls of a process chamber. Also disclosed is a method of monitoring the level of polymer particle contamination on inner walls of a process chamber.

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patent: 6825437 (2004-11-01), Nakano et al.
patent: 2005/0173375 (2005-08-01), Mitrovic et al.
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patent: 04-179142 (1992-06-01), None
patent: 11-297629 (1999-10-01), None
patent: 2003-249488 (2003-09-01), None

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