System and method for monitoring defects in structures

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Reexamination Certificate

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06922641

ABSTRACT:
A system and method for monitoring defects in a structure are provided. The system includes a power supply for supplying an electric current to a monitoring area of the structure and a reference; a measurement circuit for measuring a potential drop across at least two contact points of the monitoring area and at least two contact points of the reference; and a processor adapted to determine a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure. The method includes the steps of supplying the current to the monitoring area and the reference; measuring a first potential drop across the monitoring area and the reference; and determining the ratio indicative of the percentage change in the thickness of the structure.

REFERENCES:
patent: 2476943 (1949-07-01), Brady
patent: 4425193 (1984-01-01), Taylor
patent: 4656595 (1987-04-01), Hognestad
patent: 4683419 (1987-07-01), Neuelmann et al.
patent: 0169223 (2001-09-01), None
patent: 0239102 (2002-05-01), None
“New Technique Monitors Pipeline Corrosion, Cracking,”, Strommen et al., Oil and Gas Journal, vol. 91, No. 52, Dec. 27, 1993, pp. 88-92.

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