Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
2007-07-26
2010-12-07
Jones, Hugh (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
Reexamination Certificate
active
07848907
ABSTRACT:
A system and method for modeling stochastic behavior of a system of N similar statistical variables using N uncorrelated/independent random model parameters. More particularly, a system and method of modeling device across chip variations and device mismatch. The method includes modeling stochastic behavior of a system of N similar statistical variables using N uncorrelated/independent random model parameters. The method includes providing a system of N similar statistical variables, wherein each stochastic variable has a same standard deviation. The method further includes partially correlating each and every pair of stochastic variables among N variables, wherein a degree of partial correlation is a same for all pairs of variables. A statistical model is constructed to represent a system of N stochastic variables in which only N independent stochastic model parameters are used. A one-to-one mapping relation exists between N model parameters and the N variables. The method further includes finding unique values of the N model parameters given a set of values of the N variables. Reversely, the method also includes finding the values of the N variables given a set of values of the N model parameters.
REFERENCES:
patent: 2006/0100873 (2006-05-01), Bittner et al.
J. Watts , N. Lu , C. Bittner , S. Grundon and J. Oppold “Modeling FET variation within a chip as a function of circuit design and layout choices,” Proc. NSTI Nanotech, Workshop Compact Modeling, 2005, pp. 1-25, obtained from http://www.nsti.org/Nanotech2005/WCM2005/WCM2005-JWatts.pdf.
International Business Machines - Corporation
Jones Hugh
Kotulak Richard
Roberts Mlotkowski Safran & Cole P.C.
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