System and method for measuring transistor leakage current...

Details System and method for measuring transistor leakage current... System and method for measuring transistor leakage current...

2005-04-19

2005-04-19

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06882172

ABSTRACT:
A method of measuring the transistor leakage current. In one embodiment, the method involves driving a ring oscillator with a dynamic node driver having a leakage test device biased to an off state to produce a test signal. The test signal is extracted and the frequency is measured. The leakage current is estimated from the measured frequency.

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