System and method for measuring the temperature of a device

Details System and method for measuring the temperature of a device System and method for measuring the temperature of a device

2005-11-15

2010-11-02

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

Reexamination Certificate

active

07826998

ABSTRACT:
A method of measuring the temperature of device under test includes the steps of injecting a first current into an on-chip diode wherein a die containing the on-chip diode is under test. A second current is injected into the on-chip diode. A junction temperature is calculated based on the first current and the second current.

REFERENCES:
patent: 3781648 (1973-12-01), Owens
patent: 4450367 (1984-05-01), Whatley
patent: 4849684 (1989-07-01), Sonntag et al.
patent: 4935690 (1990-06-01), Yan
patent: 5049806 (1991-09-01), Urakawa et al.
patent: 5233161 (1993-08-01), Farwell et al.
patent: 5406212 (1995-04-01), Hashinaga et al.
patent: 5451860 (1995-09-01), Khayat
patent: 5559425 (1996-09-01), Allman
patent: 6149299 (2000-11-01), Aslan et al.
patent: 6181121 (2001-01-01), Kirkland et al.
patent: 6870357 (2005-03-01), Falik
patent: 7042689 (2006-05-01), Chen
patent: 7089146 (2006-08-01), D'Aquino et al.
patent: 7097354 (2006-08-01), Miteva et al.
patent: 7102417 (2006-09-01), Gordon et al.
patent: 7276957 (2007-10-01), Bhattacharya et al.
patent: 2006/0063285 (2006-03-01), Miller
patent: 03-154832 (1991-07-01), None
Current Source, Wikipedia, pp. 1-6, modified Oct. 26, 2007.
USPTO Notice of Allowance for U.S. Appl. No. 09/262,430 dated Sep. 11, 2000; 2 pages.
USPTO Final Rejection for U.S. Appl. No. 09/262,430 dated Jun. 21, 2000; 9 pages.
USPTO Non-Final Rejection for U.S. Appl. No. 09/262,430 dated Feb. 4, 2000; 6 pages.

Affiliated with

Also associated with

Rating

System and method for measuring the temperature of a device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for measuring the temperature of a device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring the temperature of a device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4239538