System and method for measuring the area and dimensions of apert

Details System and method for measuring the area and dimensions of apert System and method for measuring the area and dimensions of apert

1984-01-19

1985-12-03

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358 93, 358106, H04N 718

Patent

active

045569029

ABSTRACT:
A system for measuring the average area of apertures in an opaque member scans a large number of lines across the apertures in orthogonal directions. The width of two apertures are measured to obtain an average width. The lengths of two apertures are measured to obtain an average length. The average width and length are multiplied to obtain an average area. The width and length measurements are not necessarily from the same two apertures within the member.

REFERENCES:
patent: 3872243 (1975-03-01), Soames et al.
patent: 3918815 (1975-11-01), Gadbois
patent: 3954337 (1976-05-01), Ragland, Jr.
patent: 3980870 (1976-09-01), Kawahara
patent: 4289406 (1981-09-01), Maddox
patent: 4319272 (1982-03-01), Henry
patent: 4400233 (1983-08-01), Rangachar
patent: 4417274 (1983-11-01), Henry
patent: 4454541 (1984-06-01), Duschl
patent: 4480264 (1984-10-01), Duschl

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