Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-26
2005-04-26
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C700S079000
Reexamination Certificate
active
06885949
ABSTRACT:
A system for measuring at least one parameter is provided. The system includes a control logic arrangement powered by a power source, and an intrinsically safe barrier operatively connected to the control logic arrangement, and also powered by the same power source. The intrinsically safe barrier is adapted to be operatively connected to at least one sensor which is also powered by the same power source. The sensor is configured to communicate data representing a parameter to the control logic arrangement via the intrinsically safe barrier. In one embodiment, the control logic arrangement, the intrinsically safe barrier and the sensor are galvonically isolated from external components and/or provided in one enclosure.
REFERENCES:
patent: 4211113 (1980-07-01), Harrison
patent: 5164607 (1992-11-01), Weigert et al.
patent: 5305639 (1994-04-01), Pontefract
patent: 5828567 (1998-10-01), Eryurek et al.
patent: 5876122 (1999-03-01), Eryurek
patent: 6021162 (2000-02-01), Gaboury et al.
patent: 6065332 (2000-05-01), Dominick
Dorsey & Whitney LLP
Hoff Marc S.
Kim Paul
Smar Research Corporation
LandOfFree
System and method for measuring system parameters and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for measuring system parameters and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring system parameters and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3375311