Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-06-12
2008-10-07
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C324S763010, C323S282000, C323S283000, C323S304000, C323S311000, C363S065000, C363S073000
Reexamination Certificate
active
07433800
ABSTRACT:
A system for measuring performance of a voltage regulator module (VRM) attached to a microprocessor includes: a voltage transient tester (VTT) fixture (5) for setting different working voltage levels of the VRM; an oscillograph (2) for measuring transient voltage levels of the VRM, and generating a transient voltage waveform according to the transient voltage levels; an voltmeter (3) for measuring steady voltage levels of the VRM under thermal effects generated by the microprocessor; a direct current (DC) electronic load (4) for educing load currents from the VRM; and a measurement control module (10) installed in a computer (1) for generating load current control signals, controlling the DC electronic load to educe the load currents from the VRM according to the load current control signals, and generating a performance report of the VRM by integrating various measurement results.
REFERENCES:
patent: 6795009 (2004-09-01), Duffy et al.
patent: 7000122 (2006-02-01), Zafarana et al.
patent: 2004/0150928 (2004-08-01), Goodfellow et al.
patent: 2004/0227538 (2004-11-01), Harris
Chen Wei-Yuan
Ku Sung-Kuo
Ou Yang Ming-Shiu
Wang Cho-Hao
Barlow Jr. John E
Chung Wei Te
Hon Hai Precision Industry Co. Ltd.
Vo Hien X
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