Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-01
2008-01-01
Nguyen, Vinh Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07315178
ABSTRACT:
An integrated circuit, in accordance with one embodiment of the present invention, includes a first device under test (DUT) module coupled to a first ring oscillator module and a second DUT module coupled to a second ring oscillator module. The first DUT module is biased such that interface traps are generated during a first mode. The generated interface traps result in a decrease in a first drive current of the first DUT module. The second device under test module is biased to maintain a reference drive current during the first mode. The operating frequency of the first ring oscillator module, during a second mode, is a function of the first drive current. The operating frequency of the second ring oscillator module, during the second mode, is a function of the reference drive current. The integrated circuit may also include a comparator module for generating an output signal as a function of a difference between the operating frequency of the first and second ring oscillator modules.
REFERENCES:
patent: 4739252 (1988-04-01), Malaviya et al.
patent: 5410278 (1995-04-01), Itoh et al.
patent: 5568103 (1996-10-01), Nakashima et al.
patent: 5594360 (1997-01-01), Wojciechowski
patent: 5680359 (1997-10-01), Jeong
patent: 5764110 (1998-06-01), Ishibashi
patent: 5796313 (1998-08-01), Eitan
patent: 5811983 (1998-09-01), Lundberg
patent: 5963043 (1999-10-01), Nassif
patent: 5977763 (1999-11-01), Loughmiller et al.
patent: 6011403 (2000-01-01), Gillette
patent: 6172943 (2001-01-01), Yuzuki
patent: 6229747 (2001-05-01), Cho et al.
patent: 6242936 (2001-06-01), Ho et al.
patent: 6242937 (2001-06-01), Lee et al.
patent: 6407571 (2002-06-01), Furuya et al.
patent: 6426641 (2002-07-01), Koch et al.
patent: 6476632 (2002-11-01), La Rosa et al.
patent: 6489796 (2002-12-01), Tomishima
patent: 6535014 (2003-03-01), Chetlur et al.
patent: 6657504 (2003-12-01), Deal et al.
patent: 6724214 (2004-04-01), Manna et al.
patent: 6731179 (2004-05-01), Abadeer et al.
patent: 6762966 (2004-07-01), LaRosa et al.
patent: 6798230 (2004-09-01), Taylor et al.
patent: 6815971 (2004-11-01), Wang et al.
patent: 2003/0189465 (2003-10-01), Abadeer et al.
patent: 2004/0148111 (2004-07-01), Gauthier et al.
patent: 1 398 639 (2004-03-01), None
Oner, H. et al., “A Compact Monitoring Circuit for Real-Time On-Chip Diagnosis of Hot-Carrier Induced Degradation”, Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings, IEEE International Conference on Monterey, CA, Mar. 17, 1997-Mar. 20, 1997, pp. 72-76.
Reddy, V. et al., “Impact of Negative Bias Temperature Instability on Digital Circuit Reliability” 2002 IEEE International Reliability Physics Symposium Proceedings. Dallas, TX Apr. 7, 2002-Apr. 11, 2002; IEEE International Reliability Physics Symposium, NY, NY; IEEE, US, Apr. 7, 2002, pp. 248-254.
G. Chen, et al., “Dynamic NBTI of p-MOS Transistors and Its Impact on MOSFET Scaling,” IEEE Electron Device Letters, 2002.
Laura Peters, “NBTI: A Growing Threat to Device Reliability”, Semiconductor International, Mar. 1, 2004, <http://www.reed-electronics.com/semiconductor/article/CA386329?industryid=3033>.
Nguyen Trung Q.
Nguyen Vinh Tran
Transmeta Corporation
LandOfFree
System and method for measuring negative bias thermal... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for measuring negative bias thermal..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring negative bias thermal... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2772596