Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-05-17
2005-05-17
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S117000, C702S124000, C324S642000
Reexamination Certificate
active
06895343
ABSTRACT:
An apparatus includes a device under test, a network analyzer, an internal amplifier, a first switch, a second switch, a third switch, a first air-line directional coupler, and a first attenuator. A method of characterization measurement includes providing a harmonics signal from the device under test to a spectrum analyzer, providing a generated signal and a reflected signal to a first receiver disposed within a network analyzer, and recording a parameter deviation of the network analyzer.
REFERENCES:
patent: 5773985 (1998-06-01), Bradley
patent: 6066953 (2000-05-01), Wadell
patent: 6356852 (2002-03-01), Ke
patent: 6421624 (2002-07-01), Nakayama et al.
patent: 6529844 (2003-03-01), Kapetanic et al.
patent: 6714898 (2004-03-01), Kapetanic et al.
Jacobsen Robert E.
Upmaka Murthy S.
Agilent Technologie,s Inc.
Wachsman Hal
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