Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-09-04
2007-09-04
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S199000, C702S167000
Reexamination Certificate
active
10653838
ABSTRACT:
An image measurement system and method for obtaining measurement data on objects by processing images of the objects is provided. The image measurement system includes an image obtaining device (101) for obtaining a first image of an object to be measured and a second image of a standard object, and a plurality of measurement computers (103) linked to the image obtaining device via a communication network (102). The measurement computers are used for processing the first image and the second image to obtain measurement data on the object. Each of the measurement computers comprises an image obtaining module (210), an image processing module (220), and an image measuring module (230).
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Chang Chih-Kuang
Jiang Li
Chawan Sheela
Hon Hai - Precision Ind. Co., Ltd.
Hong Fu Jin Precision Ind.(Shenzhen) Co., Ltd.
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