Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-03-22
2005-03-22
Le, N. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S678000
Reexamination Certificate
active
06870375
ABSTRACT:
A method for measuring a capacitance associated with a portion of an integrated circuit is provided that includes coupling a measurement circuit to an integrated circuit. One or more transistors within the integrated circuit are initialized such that a steady-state associated with one or more of the transistors is achieved. A capacitance associated with the portion of the integrated circuit is then measured using the measurement circuit. The portion of the integrated circuit is selectively charged and discharged in response to a voltage potential being applied thereto such that a drain current is generated that serves as a basis for the capacitance measurement.
REFERENCES:
patent: 5602487 (1997-02-01), Manku
patent: 5999010 (1999-12-01), Arora et al.
patent: 6133949 (2000-10-01), Reich
patent: 6291254 (2001-09-01), Chou et al.
patent: 6366098 (2002-04-01), Froment
patent: 6486680 (2002-11-01), Mull
patent: 6501283 (2002-12-01), Lindolf et al.
patent: 6549029 (2003-04-01), Hsieh et al.
patent: 20020116696 (2002-08-01), Suaya et al.
patent: 20020130674 (2002-09-01), Lagowski et al.
Deng Xiaowei
Gallia James David
Sarma Robin C.
Brady III W. James
Le N.
McLarty Peter K.
Nguyen Hoai-An D.
Telecky , Jr. Frederick J.
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