System and method for measurement of small-angle or...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S662000

Reexamination Certificate

active

07075317

ABSTRACT:
A sensor for measurement of small-angle or small-displacement position incorporates multiple independent capacitors in a symmetric relationship. The device presents its output as a standard bridge configured differential signal, which can be interpreted and measured using conventional electronic demodulation means. The device includes an excitation array, a measurement array and an active rotor or linear array. The active array is coupled to a moving object and measured relative to the measurement and excitation arrays. The active array may be floating, grounded or driven by an electrical signal. However, driving the active array with signals sensed by the measurement array allows for reduced sensitivity to unwanted signals not in the measurement direction.

REFERENCES:
patent: 3238523 (1966-03-01), Masel et al.
patent: 3717869 (1973-02-01), Batz
patent: 3766544 (1973-10-01), Batz
patent: 3774238 (1973-11-01), Hardway, Jr.
patent: 4238781 (1980-12-01), Vercellotti et al.
patent: 4418347 (1983-11-01), Tanaka et al.
patent: 4429307 (1984-01-01), Fortescue
patent: 4477810 (1984-10-01), Tanaka et al.
patent: 4563683 (1986-01-01), Tanaka et al.
patent: 4631524 (1986-12-01), Brooke et al.
patent: 4694275 (1987-09-01), Cox
patent: 4743902 (1988-05-01), Andermo
patent: 4864295 (1989-09-01), Rohr
patent: 4878013 (1989-10-01), Andermo
patent: 4879552 (1989-11-01), Arai et al.
patent: 4882536 (1989-11-01), Meyer
patent: 4959615 (1990-09-01), Andermo
patent: 4972725 (1990-11-01), Choisent
patent: 5028875 (1991-07-01), Peters
patent: 5315865 (1994-05-01), Hornfeck et al.
patent: RE34741 (1994-09-01), Andermo
patent: 5537109 (1996-07-01), Dowd
patent: 5631409 (1997-05-01), Rajagopal et al.
patent: 5657006 (1997-08-01), Kinoshita et al.
patent: 5691646 (1997-11-01), Sasaki
patent: 5731707 (1998-03-01), Andermo
patent: 6118283 (2000-09-01), Cripe
patent: 6492911 (2002-12-01), Netzer
patent: 2004/0046548 (2004-03-01), Pettersson et al.
patent: 0 241 913 (1987-10-01), None
patent: 60088314 (1985-05-01), None
patent: 03061816 (1991-03-01), None
patent: 05264291 (1993-10-01), None
International Search Report and Written Opinion (dated Jan. 20, 2006).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for measurement of small-angle or... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for measurement of small-angle or..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measurement of small-angle or... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3557505

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.