Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2008-03-04
2008-03-04
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S016000, C438S108000
Reexamination Certificate
active
11173357
ABSTRACT:
A system and method for matching chip and package terminals and for packaging integrated circuits. Various aspects of the present invention may comprise receiving as input a first list of chip terminal identifiers and a second list of package terminal identifiers. The first and second lists may be analyzed with a first string-matching algorithm to determine a first set of matching pairs of chip terminals and package terminals. The first and second lists may also be analyzed with a second string-matching algorithm to determine a second set of matching pairs of chip terminals and package terminals. The first and second sets of matching pairs may be compared to identify common matching pairs between the first and second sets of matching pairs. An indication of the common matching pairs may then be output.
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Ju Chiping
Wu Yung-Wen
Broadcom Corporation
McAndrews Held & Malloy Ltd.
Picardat Kevin M.
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