Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-05-09
2010-02-16
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S109000, C702S124000, C327S100000
Reexamination Certificate
active
07664621
ABSTRACT:
The present disclosure relates to a system and method for mapping system transfer functions. Accordingly, some operations may include receiving a first intermediate signal that is at least partially based upon a first reference signal. A second intermediate signal is received that is at least partially based upon a second reference signal. An output signal is generated that is based upon the difference between the first intermediate signal and the second intermediate signal. A first anticipated differential change in the output signal is determined, the first anticipated differential change to occur based upon a transition in the first reference signal. A second anticipated differential change in the output signal is determined, the second anticipated differential change to occur based upon a transition in the second reference signal. Numerous other operations are also within the scope of the present disclosure.
REFERENCES:
patent: 4486688 (1984-12-01), Schmitz
patent: 6850044 (2005-02-01), Hansen et al.
patent: 2005/0078026 (2005-04-01), Cai
Liggiero, III Richard
Perkins Philip E.
Reiss Alan J.
Colandreo, Esq. Brian J
Holland & Knight LLP
LTX Corporation
Wachsman Hal D
Whittenberger Mark H.
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