Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Manufacturing optimizations
Reexamination Certificate
2011-07-19
2011-07-19
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Design of semiconductor mask or reticle
Manufacturing optimizations
C716S055000
Reexamination Certificate
active
07984393
ABSTRACT:
The present disclosure is directed a method for preparing photomask patterns. The method comprises receiving drawn pattern data for a design database, the drawn pattern data describing device circuit features and dummy features. The dummy features have first target patterns. Mask pattern data is generated for the dummy features, wherein one or more of the dummy features have second target patterns that are different from the first target patterns. The mask pattern data is corrected for proximity effects.
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Aton Thomas J.
Vickery Carl A.
Brady III Wade J.
Franz Warren L.
Siek Vuthe
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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