System and method for locating irregular edges in image data

Details System and method for locating irregular edges in image data System and method for locating irregular edges in image data

2006-05-16

2006-05-16

Chawan, Sheela (Department: 2623)

Image analysis

Applications

Manufacturing or product inspection

C382S199000, C382S266000

Reexamination Certificate

active

07046837

ABSTRACT:
A system for processing image data, such as an image of a die cut from a silicon wafer, is provided. The system includes an irregular edge detection system, which can locate edge data of a feature of the image data, such as the edge of a probe mark in a bond pad. A feature area calculation system is connected to the irregular edge detection system, such as by accessing data stored by the irregular edge detection system. The feature area calculation system can receive the edge data of the feature and determining the area of the feature, such as by summing normalized pixel area values. The irregular edge detection system uses interpolation to locate edges that occur between the centerpoints of adjacent pixels.

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