Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-29
2006-08-29
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C717S162000, C717S166000
Reexamination Certificate
active
07099791
ABSTRACT:
A method for linking compiled pattern data and loading the data into tester hardware includes the steps of generating a composite object that includes a shared resource, determining a local shared resource specific to a test instrument that is associated with the shared resource in the composite object, assigning a local reconciled value or address to the local shared resource, and loading the local shared resource into the test instrument.
REFERENCES:
patent: 5481550 (1996-01-01), Garcia et al.
patent: 2005/0261857 (2005-11-01), Jones et al.
Bui Bryan
Credence Systems Corporation
Walling Meagan S
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