Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-03-04
2008-03-04
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07339387
ABSTRACT:
A burn-in system links a Burn-In Board (BIB) Loader/Unloader (BLU) to a burn-in chamber rack using a BIB transfer module. The BIB transfer module is capable of transferring a BIB between the BLU and the burn-in chamber rack by moving the BIB in at least two perpendicular directions while minimizing the physical footprint required by the BIB transfer module. The system supports slot level burn-in of components as opposed to batch level burn-in because the burn-in chamber rack may begin the burn-in process as soon as a BIB is delivered to an individual chamber slot in the burn-in chamber rack. The BIB transfer module may easily be detached and separated from the BLU and the burn-in chamber rack without affecting the continuing operation of the BLU and the burn-in chamber rack.
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Casey Brett P.
Dangelo Daniel J.
Schroeder Chris
Intel Corporation
Marger Johnson & McCollom PC
Nguyen Ha Tran
Nguyen Tung X.
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