System and method for indication of fuse defects based upon...

Details System and method for indication of fuse defects based upon... System and method for indication of fuse defects based upon...

2005-12-13

2005-12-13

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S035000, C702S036000

Reexamination Certificate

active

06975945

ABSTRACT:
One embodiment of a method comprises retrieving test data corresponding to test results from a plurality of fuses, each one of the plurality of fuses residing on a different one of a plurality of semiconductor devices and each one of the plurality of fuses having a common location on the semiconductor devices, determining from the test data which of the plurality of fuses are defective fuses, and specifying on an output report the common location of the determined defective fuses when a number of the defective fuses are at least equal to a predefined portion of the plurality of fuses.

REFERENCES:
patent: 5394369 (1995-02-01), Kagami
patent: 5835431 (1998-11-01), Miner et al.
patent: 5933376 (1999-08-01), Lee
patent: 6008523 (1999-12-01), Narayan et al.
patent: 6119251 (2000-09-01), Cloud et al.
patent: 6266792 (2001-07-01), Wada et al.
patent: 6408401 (2002-06-01), Bhavsar et al.
patent: 6477095 (2002-11-01), White et al.
patent: 6479310 (2002-11-01), Paterno
patent: 6578157 (2003-06-01), Weber et al.
patent: 6701003 (2004-03-01), Feinstein
patent: 2002/0085439 (2002-07-01), White et al.
patent: 2002/0133770 (2002-09-01), Cowles et al.
patent: 2004/0140835 (2004-07-01), Lehmann et al.

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