Electrophotography – Diagnostics – By inspection of copied image
Reexamination Certificate
2007-02-14
2009-12-08
Chen, Sophia S (Department: 2852)
Electrophotography
Diagnostics
By inspection of copied image
C347S117000, C399S301000
Reexamination Certificate
active
07630653
ABSTRACT:
A printing system and method is provided for adjusting image on paper (IOP) misregistration in a printing device. The method includes initiating marking of a substrate with a test pattern, the test pattern having at least one feature, and the marked substrate including at least two features including the at least one feature of the test pattern; sensing in a first sensing operation, as the substrate is transported in a process direction, a first feature of the marked substrate; sensing in a second sensing operation, as the substrate is transported in the process direction, a second feature of the marked substrate, wherein at least one of the first and second features is included in features of the test pattern; measuring a time differential between the sensing of the first and second features; and determining an IOP misregistration characteristic based on the measured time differential.
REFERENCES:
patent: 5260725 (1993-11-01), Hammond
patent: 5374993 (1994-12-01), Diehl et al.
patent: 5555084 (1996-09-01), Vetromile et al.
patent: 5600350 (1997-02-01), Cobbs et al.
patent: 5642202 (1997-06-01), Williams et al.
patent: 5678144 (1997-10-01), Osaki et al.
patent: 6452147 (2002-09-01), Inada
patent: 6467867 (2002-10-01), Worthington et al.
patent: 6763199 (2004-07-01), Conrow et al.
patent: 6895210 (2005-05-01), Quesnel
patent: 6973272 (2005-12-01), Yamamoto et al.
patent: 7133056 (2006-11-01), Tanaka et al.
patent: 7420719 (2008-09-01), Mongeon
patent: 2004/0239746 (2004-12-01), Ozawa et al.
patent: 2005/0207768 (2005-09-01), Suzuki
patent: 2006/0153603 (2006-07-01), Nishikawa et al.
patent: 2007/0172264 (2007-07-01), An
Carter DeLuca Farrell & Schmidt LLP
Chen Sophia S
Xerox Corporation
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