System and method for improving dynamic range of analog-to...

Details System and method for improving dynamic range of analog-to... System and method for improving dynamic range of analog-to...

2005-03-08

2005-03-08

Wamsley, Patrick (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C323S313000, C327S539000

Reexamination Certificate

active

06864814

ABSTRACT:
An analog to digital converter (“ADC”) is provided that can be used in a system with an internal or external CPU or in an ASIC. The ADC includes a band gap reference (BGR) circuit whose output is internally coupled to an analog input of the ADC; and a positive analog supply voltage (AVDD) and a positive analog reference voltage (REFP) operationally coupled to a same voltage supply; wherein a BGR value is used by a CPU as a calibration constant for determining an AVDD value, a REFP value, and a Bit Weight value.

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