Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-02-24
2010-06-29
Lee, Hwa S. Andrew (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C345S166000
Reexamination Certificate
active
07746477
ABSTRACT:
The present invention discloses an optic system for providing illumination and imaging functions in an optical navigation system. Generally, the optic system includes a unitary optic component having an illumination lens and at least one prism to project a collimated beam of light from a light source in the optical navigation system onto a surface, and an imaging lens to image at least a portion of the illuminated surface to an array of photosensitive elements. In one embodiment, optic system further includes an aperture component having a precision aperture, the aperture component configured to locate the precision aperture between the imaging lens of the unitary optic component and the array of photosensitive elements in a path of light reflected from the portion of the illuminated surface to the array of photosensitive elements. Other embodiments are also described.
REFERENCES:
patent: 5692083 (1997-11-01), Bennett
patent: 6226092 (2001-05-01), de Lega
patent: 6327038 (2001-12-01), Maxey
patent: 6452726 (2002-09-01), Mandella
patent: 7161682 (2007-01-01), Xie et al.
patent: 2004/0227954 (2004-11-01), Xie
patent: 2005/0024336 (2005-02-01), Xie et al.
J.W. Goodman, “Statistical Properties of Laser Speckle Patterns,” in “Laser Speckle and Related Phenomena,” edited by J.C. Dainty, Topics in Applied Physics, vol. 9, Springer-Verlag, 1984, pp. 39-40; 2 pages.
Huber Edward D.
Spurlock Brett A.
Trisnadi Jahja I.
Cypress Semiconductor Corporation
Lee Hwa S. Andrew
LandOfFree
System and method for illuminating and imaging a surface for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for illuminating and imaging a surface for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for illuminating and imaging a surface for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4188624