Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-01-30
2007-01-30
Bali, Vikkram (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
09819922
ABSTRACT:
A system and method for identifying defects in a composite structure is provided. The system includes a camera for receiving images of the composite structure, a processor for manipulating the images and outputting a response based on the images, and a light source for illuminating the composite structure. Advantageously, the light source is positioned at an oblique angle relative to the composite structure and comprises an infrared component that is differently reflected by defects in the composite structure than from portions of the composite structure that are defect free. Based on the response provided by the processor, defects that meet predetermined criteria can be identified.
REFERENCES:
patent: 3243509 (1966-03-01), Stut
patent: 4064534 (1977-12-01), Chen et al.
patent: 4120402 (1978-10-01), Swanson
patent: 4135204 (1979-01-01), Davis et al.
patent: 4415811 (1983-11-01), Beck et al.
patent: 4437115 (1984-03-01), Yoshida
patent: 4445185 (1984-04-01), Davis, Jr. et al.
patent: 4760444 (1988-07-01), Nielson et al.
patent: 5007096 (1991-04-01), Yoshida
patent: 5016099 (1991-05-01), Bongardt et al.
patent: 5058174 (1991-10-01), Carroll
patent: 5058497 (1991-10-01), Bishop et al.
patent: 5187573 (1993-02-01), Yoshida
patent: 5237407 (1993-08-01), Crezee et al.
patent: 5253302 (1993-10-01), Massen
patent: 5258917 (1993-11-01), Bruder et al.
patent: 5263094 (1993-11-01), Laitinen et al.
patent: 5331312 (1994-07-01), Kudoh
patent: 5333208 (1994-07-01), Massen
patent: 5359525 (1994-10-01), Weyenberg
patent: 5426509 (1995-06-01), Peplinski
patent: 5440650 (1995-08-01), Hieda et al.
patent: 5452370 (1995-09-01), Nagata
patent: 5486819 (1996-01-01), Horie
patent: 5513537 (1996-05-01), Brooks et al.
patent: 5533628 (1996-07-01), Tao
patent: 5646682 (1997-07-01), Sogabe et al.
patent: 5652432 (1997-07-01), Yaginuma
patent: 5700337 (1997-12-01), Jacobs et al.
patent: 5732147 (1998-03-01), Tao
patent: 6005965 (1999-12-01), Tsuda et al.
patent: 6064429 (2000-05-01), Belk et al.
patent: 6295129 (2001-09-01), Bjork
patent: 6603874 (2003-08-01), Stern et al.
Material Selection/Fabrication Issues for Thermoplastic Fiber Placement, Journal of Thermoplastic Composite Materials, vol. 8, pp. 2-7 (Technomic Publishing Co., Inc.) (1995).
Manufacturing of Smart Structures Using Fiber Placement Manufacturing Processes; SPIE, vol. 2447, pp. 266-273 (1995).
Fiber Placement Inspection System and Experimental Approach; 43rd Int'l SAMPE Symposium, pp. 957-963 (Society for the Advancement of Material and Process Engineering) (1998).
Engelbart Roger W.
Holmes Scott T.
Walters Craig
Alston & Bird LLP
Bali Vikkram
LandOfFree
System and method for identifying defects in a composite... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for identifying defects in a composite..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for identifying defects in a composite... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3763412